Revolutionize your yield management.
yieldHUB is a SaaS company (with an on premise option) that provides yield management and comprehensive data analysis for semiconductor companies. Our customers include leading fabless companies and IDMs worldwide.
We serve companies who work across the entire semiconductor industry, from Computer and Peripheral Devices to Consumer Electronics, Telecommunications Equipment, Industrial Electronics, Defence and Space and Transportation Technology.
One purpose-built platform that can do it all
chips
yieldHUB has helped improve the yield for manufacturers of 60 billion chips in past 12 months.
countries
Our system is used in 21 countries
users
There are thousands of yieldHUB users around the world
Rave-worthy features our customers love
yieldHUB Characterize
Speed up a key part of the NPI process with virtual retest and outlier analysis built into our automated, scalable, cloud-based solution.
Parametric analysis
Analyze parameters and tests in detail, including and applying filters.
Drift analysis
Quickly analyse drift across all your tests when you do the likes of burn-in and life test or temperature guard-banding.
Bin analysis
Bin galleries, stacking of wafermaps, trends.
Gage R&R
Detect tests that are sensitive to set-up and fix them before release. This ensures consistency across sites, testers and interface cards.
Calculated Tests/Multivariate analysis
Create tests from other tests, e.g. test1/test2 or test1 with a different set of limits. Done virtually in the database.
WAT Analysis and PCM
Analysis of parameters tested at Wafer Acceptance step.
Compare site vs site performance
Be on top of site performance issues, even search all the DB for wafers that had excessive loss due to site issues.
Wafer sort analysis
Wafer visualisation, parametric and bins, yield. Stacking hundreds of wafers at a time.
Detect Program Changes
Check if the program changed even if the name didn’t. Check the changes from one program to another (eg missing tests, limits widened etc).
ANOVA
See which factors are most affecting yield and parametric performance.
CP1/CP2 analysis and consolidation
Variation of Wafer Sort testing (typically CP1 at ambient and CP2 at hot).
Auto cleansing of data
Incorporating automated re-screen algorithms to clean up final test data before you look at it.
Correlations
Ability to correlate performance across manufacturing stages, e.g. what effect do fab parameters have on wafer sort/final test.
Statistical Bin Limits
Calculate and save SBL limits interactively.
Lots on Hold Dashboard
Add material causing alerts to a dashboard you can bookmark.
Multi-die analysis
Correlate data from multi-die packages to wafer fab.
Outlier Detection
Detect outliers automatically using public domain algorithms and your own algorithms.
Why do industry leaders choose us?
Scalability:
We’re scalable from a few GB to many TBs. We handle your data as you grow.
Cost:
We suit every budget - the more power you want, the more you pay.
Reduced hiring needs:
We reduce the amount of engineering time needed for yield improvement.
Collaboration:
Communicate across time-zones and locations more easily.
)
Fabless semiconductor companies
yieldHUB's specialised yield management software helps fabless companies to grow. We enable you to see what's happening in manufacture, then solve problems as needed. This gives you oversight to maximise yield. Our fabless customers range from start-ups to market-leading companies.
)
IDM (Integrated Device Manufacturers)
Manage yield throughout your company with yieldHUB. Our system helps you collaborate with teams worldwide. It sends reports regularly and alerts when necessary to help you stay on top of production. Spend less time analysing data and more time solving problems with yieldHUB.
)
)
)