Test Cost Reduction is achieved typically by reducing test time.
Reducing test time is achieved by testing on more sites in parallel and eliminating redundant tests. Also by reducing set-up time for each lot and wafer.
yieldHUB captures test time if the test time from datalogs. yieldHUB also visualises the delays in production wafer to wafer, datalog to datalog. It also detects test that have never failed.
The % of units that falsely fail due to site to site variation is also captured. This allows you to picture how good and stable your parallel testing is.
Using the test time information, the site loss %, which tests never fail and visualising production delays will provide most of what you need to reduce test time.
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