Test Time Reduction

///Test Time Reduction
Test Time Reduction 2018-05-27T16:20:16+00:00

There are a number of ways to reduce test time. Analysing millions of devices worth of data and identifying tests that never fail is a method that has been provided to our customers for many years.

Another effective method is to fully understand the performance of the test facility, this then allows wait times to be reduced and the performance rechecked before the facility is used in production. yieldHUB’s Gage R&R tool is designed to help with this as well as finding yield issues.

Deeper analysis of test data can also result in identifying which tests are key to rejecting devices. This deep analysis is dependant upon what information in contained within your datalogs and how the data is collected. Contact our applications team to discuss further.

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