Are Lots on Hold holding you back?
One of the biggest bottlenecks in any Subcon is Lots on Hold. The problem occurs many times a week on most factory floors. It’s something [...]
9 09, 2019
26 08, 2019
The hidden potential of Test Engineers
Design Engineers are seen as the cornerstone of new projects in many semiconductor companies. Working away with the team to design the next product, making [...]
21 08, 2019
yieldHUB announces significant increase in speed of cloud-based yield analysis
Limerick- August 21st 2019 yieldHUB announced a significant increase in the speed of their yield management system. It is now up to five times faster [...]
12 08, 2019
Why should OSATs work with yieldHUB?
As a leading yield management company, we also work with OSATs and Test Houses, and partner with IT solution providers. Today, we will give you [...]
29 07, 2019
A great mix of customers
Here at yieldHUB, we have several dozen customers varying from small startups to multi-billion dollar corporations and in many countries. There are advantages to having [...]
15 07, 2019
Who should control Part Average Testing (PAT)?
With ever-increasing demands in the automotive industry, more and more semiconductor companies are interested in monitoring and improving quality and reliability. Outlier Detection, more specifically, [...]
10 06, 2019
“A Test Program Never Refused Tests”
If someone said that paper never refused ink, they could have said the same about test programs and tests. Early on in my career as [...]
4 06, 2019
yieldHUB chosen by EnSilica for Outlier Detection
Limerick, Ireland, June 4th, 2019 Today yieldHUB, an Irish company based in Limerick, announced EnSilica as a new customer. EnSilica, a fast-growing UK fabless ASIC [...]
14 05, 2019
How to sell YMS to upper management
“I really like your product, I just need to convince my boss….” This is a phrase that we hear at least once a week in [...]
8 05, 2019
How much work goes into one plot?
A customer recently wanted to analyze the parametric variation of a key parameter measured at final test at the end of manufacturing. How does that [...]