What is Engineering Data Analysis?

yieldHUB’s Level 1 (Engineering Data Analysis) allows you to upload STDF data (or equivalent) to our servers and create powerful interactive reports from your browser from the data in seconds. You can add comments and share reports and analyses with other users. No software is required, just your browser.

Who uses this?

Test engineers

What kind of companies benefit from this level?

Many companies start off at this level. The power of yieldHUB at this level is already greater than specialist STDF analysing desktop tools. A huge advantage of yieldHUB at this level is that the user can upload hundreds of files if they want and analyse the files together, which would be impossible for desktop tools because of RAM limitations. For example upload 10 lots of wafers, stack them and analyse the trends of the highest failing tests across all wafers in seconds.

What can you do with it?

  • Manually upload STDF data. (Automating upload is for level 3 of yieldHUB)
  • Analyse the data instantly (typically select wafers or lots and click on a report type)
  • Create a wide variety of reports and customisable charts
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What are the features of yieldHUB

Cloud-based: Access your data anytime. You and your colleagues can access your data anytime, in any timezone

Knowledge-base: Our integrated knowledge base allows you to comment on data, build and share knowledge with production, development, other engineers and even your customers

Secure: Our data is hosted on AWS (Amazon Website Services), the market leader. Your data is safe and secure.

Trust and security: Our customers access huge volumes of proprietary data every day. We have NDAs with all of our customers. We can sign one for you or provide you with a version. All employees sign confidentiality agreements. We are trusted by leading companies worldwide

User interface:  We designed yieldHUB to be easy to use. You can find complex data, presented neatly, at the touch of a button

What services and capabilities are included in level 1?

Parametric analysisAnalyze parameters and tests in detail, including and applying filters
Bin analysisBin galleries, stacking of wafermaps, trends
Indexed correlation/drift analysisPopulation drift analysis and per die drift analysis across wafer sort or packaged test strips
Test time analysisDo you store test time in your datalogs?
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How do we set it up?

Contact us today and we will talk to you about setting up a demo. If it’s STDF you should be up and running within a day. We would setup your $ site, you can upload a few datalogs and we’ll show you what you can do.

Learn about level 2