The key to semiconductor characterisation is the association of any test results to conditions applicable at the time of testing.
For example, what temperature was the fixture at? What was the power supply voltage?
These conditions can be embedded in the datalogs and we can recommend how to do this efficiently.
yieldHUB uses DTRs in STDF datalogs. In text based datalogs yieldHUB detects conditions from strings placed after the character @ in the test name.
We are flexible once the formats you like to use are consistent.