Data to generate UPH (Units per Hour) information can come automatically with the datalog data generated from a subcon.
We can track UPH information once the start and end date of a wafer (or datalog in final test) is in the datalog. You will then be in a position to correlate UPH improvement with test time improvement.
This doesn’t always follow as it can happen that a test time improvement can lead to a handler index time increase.
Either way, the first thing to do is gather the data and the tools are there in yieldHUB to help you save your test cost taking the above, and, for example, site performance into account. Related question: Do you know the average number of sites your product is running on 🙂 ?
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Contact yieldHUB today! Our global sales and support team will be happy to help.